Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process.
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| Title: | Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process. |
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| Authors: | Huang, Xiong1, Wang, Pengfei1, Zhang, Lei1, zhanglei@siat.ac.cn, Bi, Daoguang1, Li, Kun1,2, Yang, Jun3, Jian, Gang1, Wang, Quan1, Yu, Shuhui1, Sun, Rong1, Cao, Xiuhua4, Fu, Zhenxiao4, fuzx@china-fenghua.com |
| Source: | Journal of Materials Science: Materials in Electronics; Jul2023, Vol. 34 Issue 19, p1-14, 14p |
| Database: | Applied Science & Technology Source |
| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-023-10836-6 |
