Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process.
Saved in:
| Title: | Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process. |
|---|---|
| Authors: | Huang, Xiong1, Wang, Pengfei1, Zhang, Lei1, zhanglei@siat.ac.cn, Bi, Daoguang1, Li, Kun1,2, Yang, Jun3, Jian, Gang1, Wang, Quan1, Yu, Shuhui1, Sun, Rong1, Cao, Xiuhua4, Fu, Zhenxiao4, fuzx@china-fenghua.com |
| Source: | Journal of Materials Science: Materials in Electronics; Jul2023, Vol. 34 Issue 19, p1-14, 14p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 167345923 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Huang%2C+Xiong%22">Huang, Xiong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Pengfei%22">Wang, Pengfei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Lei%22">Zhang, Lei</searchLink><relatesTo>1</relatesTo>, <i>zhanglei@siat.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Bi%2C+Daoguang%22">Bi, Daoguang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Kun%22">Li, Kun</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Jun%22">Yang, Jun</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Jian%2C+Gang%22">Jian, Gang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Quan%22">Wang, Quan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu%2C+Shuhui%22">Yu, Shuhui</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sun%2C+Rong%22">Sun, Rong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Cao%2C+Xiuhua%22">Cao, Xiuhua</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Zhenxiao%22">Fu, Zhenxiao</searchLink><relatesTo>4</relatesTo>, <i>fuzx@china-fenghua.com</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jul2023, Vol. 34 Issue 19, p1-14, 14p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=167345923 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-023-10836-6 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 14 StartPage: 1 Titles: – TitleFull: Enhanced reliability of ultra-thin multilayer ceramic capacitors (MLCCs) based on re-oxidation process. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Huang, Xiong – PersonEntity: Name: NameFull: Wang, Pengfei – PersonEntity: Name: NameFull: Zhang, Lei – PersonEntity: Name: NameFull: Bi, Daoguang – PersonEntity: Name: NameFull: Li, Kun – PersonEntity: Name: NameFull: Yang, Jun – PersonEntity: Name: NameFull: Jian, Gang – PersonEntity: Name: NameFull: Wang, Quan – PersonEntity: Name: NameFull: Yu, Shuhui – PersonEntity: Name: NameFull: Sun, Rong – PersonEntity: Name: NameFull: Cao, Xiuhua – PersonEntity: Name: NameFull: Fu, Zhenxiao IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 34 – Type: issue Value: 19 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
| ResultId | 1 |
