View in EDS HTML Full Text PDF Full Text

Determination of Thermal Damage Threshold in THz Photomixers Using Raman Spectroscopy.

Saved in:
Bibliographic Details
Title: Determination of Thermal Damage Threshold in THz Photomixers Using Raman Spectroscopy.
Authors: Mikulics, Martin1,2, j.mayer@fz-juelich.dem.mikulics@fz-juelich.de, Adam, Roman3, r.adam@fz-juelich.de, Chen, Genyu4, genyuchen@gmail.com, Chakraborty, Debamitra4, dchakrab@ur.rochester.edu, Cheng, Jing4, jcheng32@ur.rochester.edu, Pericolo, Anthony5, apericol@u.rochester.edu, Komissarov, Ivan5, ikom@lle.rochester.edu, Bürgler, Daniel E.3, d.buergler@fz-juelich.de, Heidtfeld, Sarah F.3, s.heidtfeld@fz-juelich.de, Serafini, John6, serafinijr@ornl.gov, Preble, Stefan6, sfpeen@rit.edu, Sobolewski, Roman4,5, roman.sobolewski@rochester.edu, Schneider, Claus M.3, c.m.schneider@fz-juelich.de, Mayer, Joachim1,2, Hardtdegen, Hilde H.1,2, m.mikulics@fz-juelich.de
Source: Crystals (2073-4352); Aug2023, Vol. 13 Issue 8, p1267, 12p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:20734352
DOI:10.3390/cryst13081267