SMART: Selective MAC zero-optimization for neural network reliability under radiation.
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| Title: | SMART: Selective MAC zero-optimization for neural network reliability under radiation. |
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| Authors: | Rajappa, Anuj Justus1, anuj.justusrajappa@uantwerpen.be, Reiter, Philippe1, philippe.reiter@uantwerpen.be, Sartori, Tarso Kraemer Sarzi2,3, tarso.kraemer-sarzi-sartori@univ-grenoble-alpes.fr, Laurini, Luiz Henrique2, luiz-henrique.laurini@univ-grenoble-alpes.fr, Fourati, Hassen3, hassen.fourati@grenoble-inp.fr, Mercelis, Siegfried1, siegfried.mercelis@uantwerpen.be, Famaey, Jeroen1, jeroen.famaey@uantwerpen.be, Bastos, Rodrigo Possamai2, rodrigo.bastos@univ-grenoble-alpes.fr |
| Source: | Microelectronics Reliability; Nov2023, Vol. 150, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00262714 |
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| DOI: | 10.1016/j.microrel.2023.115092 |
