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SMART: Selective MAC zero-optimization for neural network reliability under radiation.

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Title: SMART: Selective MAC zero-optimization for neural network reliability under radiation.
Authors: Rajappa, Anuj Justus1, anuj.justusrajappa@uantwerpen.be, Reiter, Philippe1, philippe.reiter@uantwerpen.be, Sartori, Tarso Kraemer Sarzi2,3, tarso.kraemer-sarzi-sartori@univ-grenoble-alpes.fr, Laurini, Luiz Henrique2, luiz-henrique.laurini@univ-grenoble-alpes.fr, Fourati, Hassen3, hassen.fourati@grenoble-inp.fr, Mercelis, Siegfried1, siegfried.mercelis@uantwerpen.be, Famaey, Jeroen1, jeroen.famaey@uantwerpen.be, Bastos, Rodrigo Possamai2, rodrigo.bastos@univ-grenoble-alpes.fr
Source: Microelectronics Reliability; Nov2023, Vol. 150, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 173416159
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=173416159
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2023.115092
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      – Code: eng
        Text: English
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      – TitleFull: SMART: Selective MAC zero-optimization for neural network reliability under radiation.
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            NameFull: Rajappa, Anuj Justus
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            NameFull: Reiter, Philippe
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            NameFull: Sartori, Tarso Kraemer Sarzi
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            NameFull: Laurini, Luiz Henrique
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            NameFull: Fourati, Hassen
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            – D: 01
              M: 11
              Text: Nov2023
              Type: published
              Y: 2023
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              Value: 00262714
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              Value: 150
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            – TitleFull: Microelectronics Reliability
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