Impact of deposition temperature on electrical properties of HZO-based FeRAM.

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Bibliographic Details
Title: Impact of deposition temperature on electrical properties of HZO-based FeRAM.
Authors: Yeh, Yu-Hsuan1, Tan, Yung-Fang2, Huang, Yen-Che2, Lin, Chao Cheng3, Wu, Chung-Wei1, Zhang, Yong-Ci2, Lee, Ya-Huan1, Chang, Ting-Chang4, tcchang3708@gmail.com, Sze, Simon M.5
Source: Journal of Applied Physics; 2/14/2024, Vol. 135 Issue 6, p1-6, 6p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/5.0184841