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A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.

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Bibliographic Details
Title: A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.
Authors: Sun, X.1, Wang, S.1, Xing, W.1, Cheng, X.1, Li, L.1, Li, C.1, licw16@tju.edu.cn, Wang, Z.1, zywang@tju.edu.cn
Source: Experimental Mechanics; Apr2024, Vol. 64 Issue 3, p341-352, 12p
Database: Applied Science & Technology Source
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ISSN:00144851
DOI:10.1007/s11340-023-01026-w