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A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.

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Title: A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.
Authors: Sun, X.1, Wang, S.1, Xing, W.1, Cheng, X.1, Li, L.1, Li, C.1, licw16@tju.edu.cn, Wang, Z.1, zywang@tju.edu.cn
Source: Experimental Mechanics; Apr2024, Vol. 64 Issue 3, p341-352, 12p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 176145114
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Sun%2C+X%2E%22">Sun, X.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+S%2E%22">Wang, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Xing%2C+W%2E%22">Xing, W.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Cheng%2C+X%2E%22">Cheng, X.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+L%2E%22">Li, L.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+C%2E%22">Li, C.</searchLink><relatesTo>1</relatesTo>, <i>licw16@tju.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Z%2E%22">Wang, Z.</searchLink><relatesTo>1</relatesTo>, <i>zywang@tju.edu.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Experimental+Mechanics%22">Experimental Mechanics</searchLink>; Apr2024, Vol. 64 Issue 3, p341-352, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=176145114
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11340-023-01026-w
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 341
    Titles:
      – TitleFull: A Label-Free Measurement Method for Plane Stress States in Optical Isotropic Films with Spectroscopic Ellipsometry.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Sun, X.
      – PersonEntity:
          Name:
            NameFull: Wang, S.
      – PersonEntity:
          Name:
            NameFull: Xing, W.
      – PersonEntity:
          Name:
            NameFull: Cheng, X.
      – PersonEntity:
          Name:
            NameFull: Li, L.
      – PersonEntity:
          Name:
            NameFull: Li, C.
      – PersonEntity:
          Name:
            NameFull: Wang, Z.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2024
              Type: published
              Y: 2024
          Identifiers:
            – Type: issn-print
              Value: 00144851
          Numbering:
            – Type: volume
              Value: 64
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Experimental Mechanics
              Type: main
ResultId 1