Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer.
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| Title: | Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer. |
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| Authors: | Oroszová, Lenka1, loroszova@saske.sk, Saksl, Karel1,2, karel.saksl@tuke.sk, Csík, Dávid1,2, Nigutová, Katarína1, Molčanová, Zuzana1, Ballóková, Beáta1 |
| Source: | Coatings (2079-6412); Mar2024, Vol. 14 Issue 3, p295, 7p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20796412 |
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| DOI: | 10.3390/coatings14030295 |
