Bibliographic Details
| Title: |
Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design. |
| Authors: |
Senarath, A. S.1, aditha.s.senarath@vanderbilt.edu, Islam, S.1, Sengupta, A.2, McCurdy, M. W.2, Anderson, T.3, Jacobs, A.3, Kaplar, R.4, Ball, D. R.2, Zhang, E. X.5, Pantelides, S. T.2,6, Reed, R. A.2, Ebrish, M. A.2, Fleetwood, D. M.2, Caldwell, J. D.7, Schrimpf, R. D.2 |
| Source: |
Applied Physics Letters; 3/25/2024, Vol. 124 Issue 13, p1-7, 7p |
| Database: |
Applied Science & Technology Source |
