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Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design.

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Title: Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design.
Authors: Senarath, A. S.1, aditha.s.senarath@vanderbilt.edu, Islam, S.1, Sengupta, A.2, McCurdy, M. W.2, Anderson, T.3, Jacobs, A.3, Kaplar, R.4, Ball, D. R.2, Zhang, E. X.5, Pantelides, S. T.2,6, Reed, R. A.2, Ebrish, M. A.2, Fleetwood, D. M.2, Caldwell, J. D.7, Schrimpf, R. D.2
Source: Applied Physics Letters; 3/25/2024, Vol. 124 Issue 13, p1-7, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 176342040
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 3/25/2024, Vol. 124 Issue 13, p1-7, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=176342040
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        Value: 10.1063/5.0189744
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              Text: 3/25/2024
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