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Source–drain contact impacts on electrical performances and low frequency noise of InZnO thin-film transistors down to 7 K.

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Title: Source–drain contact impacts on electrical performances and low frequency noise of InZnO thin-film transistors down to 7 K.
Authors: Chen, Yayi1, Liu, Xingji1, Liu, Yuan1, eeliuyuan@gdut.edu.cn, Chen, Rongsheng2, Zhang, Jianfeng1, Wu, Mingchao1, Kwok, Hoi-Sing3, Zhong, Wei1, zwnice@163.com
Source: Applied Physics Letters; 4/22/2024, Vol. 124 Issue 17, p1-6, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 176871508
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Source–drain contact impacts on electrical performances and low frequency noise of InZnO thin-film transistors down to 7 K.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Chen%2C+Yayi%22">Chen, Yayi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Xingji%22">Liu, Xingji</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Yuan%22">Liu, Yuan</searchLink><relatesTo>1</relatesTo>, <i>eeliuyuan@gdut.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Chen%2C+Rongsheng%22">Chen, Rongsheng</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Jianfeng%22">Zhang, Jianfeng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Mingchao%22">Wu, Mingchao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kwok%2C+Hoi-Sing%22">Kwok, Hoi-Sing</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhong%2C+Wei%22">Zhong, Wei</searchLink><relatesTo>1</relatesTo>, <i>zwnice@163.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 4/22/2024, Vol. 124 Issue 17, p1-6, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=176871508
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/5.0204316
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1
    Titles:
      – TitleFull: Source–drain contact impacts on electrical performances and low frequency noise of InZnO thin-film transistors down to 7 K.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Chen, Yayi
      – PersonEntity:
          Name:
            NameFull: Liu, Xingji
      – PersonEntity:
          Name:
            NameFull: Liu, Yuan
      – PersonEntity:
          Name:
            NameFull: Chen, Rongsheng
      – PersonEntity:
          Name:
            NameFull: Zhang, Jianfeng
      – PersonEntity:
          Name:
            NameFull: Wu, Mingchao
      – PersonEntity:
          Name:
            NameFull: Kwok, Hoi-Sing
      – PersonEntity:
          Name:
            NameFull: Zhong, Wei
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 22
              M: 04
              Text: 4/22/2024
              Type: published
              Y: 2024
          Identifiers:
            – Type: issn-print
              Value: 00036951
          Numbering:
            – Type: volume
              Value: 124
            – Type: issue
              Value: 17
          Titles:
            – TitleFull: Applied Physics Letters
              Type: main
ResultId 1