View in EDS HTML Full Text PDF Full Text

A Deep Learning-Driven Fast Scanning Method for Micro-Computed Tomography Experiments on CMCs.

Saved in:
Bibliographic Details
Title: A Deep Learning-Driven Fast Scanning Method for Micro-Computed Tomography Experiments on CMCs.
Authors: Zhu, R.Q.1, Niu, G.H.2, Qu, Z.L.2, quzl@bit.edu.cn, Wang, P.D.2, Fang, D.N.1,2
Source: Experimental Mechanics; Sep2024, Vol. 64 Issue 7, p1053-1072, 20p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:00144851
DOI:10.1007/s11340-024-01081-x