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Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.

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Bibliographic Details
Title: Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.
Authors: Alvarez, M. A. Gomez1, Calderón-Martínez, A. I.1, Rodríguez-Melgarejo, F.1, Hernández-Landaverde, M. A.1, Meléndez-Lira, M.2, Flores-Ruiz, F. J.3, Sandoval, S. Jiménez1, sergio.jimenez@cinvestav.mx
Source: Journal of Materials Science: Materials in Electronics; Aug2024, Vol. 35 Issue 22, p1-13, 13p
Database: Applied Science & Technology Source
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ISSN:09574522
DOI:10.1007/s10854-024-13267-z