Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.

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Title: Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.
Authors: Alvarez, M. A. Gomez1, Calderón-Martínez, A. I.1, Rodríguez-Melgarejo, F.1, Hernández-Landaverde, M. A.1, Meléndez-Lira, M.2, Flores-Ruiz, F. J.3, Sandoval, S. Jiménez1, sergio.jimenez@cinvestav.mx
Source: Journal of Materials Science: Materials in Electronics; Aug2024, Vol. 35 Issue 22, p1-13, 13p
Database: Applied Science & Technology Source
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An: 179012663
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  Data: Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Aug2024, Vol. 35 Issue 22, p1-13, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=179012663
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        Value: 10.1007/s10854-024-13267-z
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      – Code: eng
        Text: English
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        PageCount: 13
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      – TitleFull: Effects of the incorporation of copper on the micro structure, charge transport and photoelectrical properties of sputtered ZnTe:Cu films.
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            NameFull: Alvarez, M. A. Gomez
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            NameFull: Calderón-Martínez, A. I.
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            NameFull: Rodríguez-Melgarejo, F.
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            NameFull: Hernández-Landaverde, M. A.
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            NameFull: Meléndez-Lira, M.
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            – D: 01
              M: 08
              Text: Aug2024
              Type: published
              Y: 2024
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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