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Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance.

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Bibliographic Details
Title: Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance.
Authors: Bel, Steven1, steven.bel@cea.fr, Lobre, Clément1, Petit, Sarah1, Veillerot, Marc1, Badano, Giacomo1
Source: Journal of Electronic Materials; Oct2024, Vol. 53 Issue 10, p5820-5828, 9p
Database: Applied Science & Technology Source
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Description
ISSN:03615235
DOI:10.1007/s11664-024-11137-2