A novel high-resolution technique for the study of deep energy levels in semiconductors based on computerized Laplace-DLTS.
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| Title: | A novel high-resolution technique for the study of deep energy levels in semiconductors based on computerized Laplace-DLTS. |
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| Authors: | Sánchez-Castro, Angel D.1, angel.sanchez@cinvestav.mx, Kudriavtsev, Yuriy1, Rivera-Álvarez, Zacarías2 |
| Source: | Journal of Materials Science: Materials in Electronics; Oct2024, Vol. 35 Issue 28, p1-10, 10p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-024-13612-2 |
