APA (7th ed.) Citation

Scognamillo, C., Catalano, A., Codecasa, L., Castellazzi, A., & d'Alessandro, V. (2025). A study of UIS ruggedness of mismatched paralleled SiC MOSFETs. Microelectronics Reliability, 164, N.PAG. https://doi.org/10.1016/j.microrel.2024.115571

Chicago Style (17th ed.) Citation

Scognamillo, C., A.P Catalano, L. Codecasa, A. Castellazzi, and V. d'Alessandro. "A Study of UIS Ruggedness of Mismatched Paralleled SiC MOSFETs." Microelectronics Reliability 164 (2025): N.PAG. https://doi.org/10.1016/j.microrel.2024.115571.

MLA (9th ed.) Citation

Scognamillo, C., et al. "A Study of UIS Ruggedness of Mismatched Paralleled SiC MOSFETs." Microelectronics Reliability, vol. 164, 2025, p. N.PAG, https://doi.org/10.1016/j.microrel.2024.115571.