A study of UIS ruggedness of mismatched paralleled SiC MOSFETs.
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| Title: | A study of UIS ruggedness of mismatched paralleled SiC MOSFETs. |
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| Authors: | Scognamillo, C.1, Catalano, A.P.1, antoniopio.catalano@unina.it, Codecasa, L.2, Castellazzi, A.3, d'Alessandro, V.1 |
| Source: | Microelectronics Reliability; Jan2025, Vol. 164, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00262714 |
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| DOI: | 10.1016/j.microrel.2024.115571 |
