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Investigation of thermal and electrical properties of Sn and Al incorporated Se–Te chalcogenide glasses for phase change memory applications.

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Bibliographic Details
Title:	Investigation of thermal and electrical properties of Sn and Al incorporated Se–Te chalcogenide glasses for phase change memory applications.
Authors:	Shoab, Mohd¹, Aslam, Zubair¹, Khatoon, Nargis Fatima¹, Saifi, Shabeena¹, Ali, Javid¹, Khan, Firoz², Alomairy, Sultan³, Zulfequar, Mohammad¹, mzulfe@redifmail.com
Source:	Journal of Materials Science: Materials in Electronics; Dec2024, Vol. 35 Issue 36, p1-19, 19p
Database:	Applied Science & Technology Source
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Description
ISSN:	09574522
DOI:	10.1007/s10854-024-14005-1