APA (7th ed.) Citation

Shoab, M., Aslam, Z., Khatoon, N. F., Saifi, S., Ali, J., Khan, F., . . . Zulfequar, M. (2024). Investigation of thermal and electrical properties of Sn and Al incorporated Se–Te chalcogenide glasses for phase change memory applications. Journal of Materials Science: Materials in Electronics, 35(36), 1. https://doi.org/10.1007/s10854-024-14005-1

Chicago Style (17th ed.) Citation

Shoab, Mohd, Zubair Aslam, Nargis Fatima Khatoon, Shabeena Saifi, Javid Ali, Firoz Khan, Sultan Alomairy, and Mohammad Zulfequar. "Investigation of Thermal and Electrical Properties of Sn and Al Incorporated Se–Te Chalcogenide Glasses for Phase Change Memory Applications." Journal of Materials Science: Materials in Electronics 35, no. 36 (2024): 1. https://doi.org/10.1007/s10854-024-14005-1.

MLA (9th ed.) Citation

Shoab, Mohd, et al. "Investigation of Thermal and Electrical Properties of Sn and Al Incorporated Se–Te Chalcogenide Glasses for Phase Change Memory Applications." Journal of Materials Science: Materials in Electronics, vol. 35, no. 36, 2024, p. 1, https://doi.org/10.1007/s10854-024-14005-1.