Investigation of thermal and electrical properties of Sn and Al incorporated Se–Te chalcogenide glasses for phase change memory applications.
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| Title: | Investigation of thermal and electrical properties of Sn and Al incorporated Se–Te chalcogenide glasses for phase change memory applications. |
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| Authors: | Shoab, Mohd1, Aslam, Zubair1, Khatoon, Nargis Fatima1, Saifi, Shabeena1, Ali, Javid1, Khan, Firoz2, Alomairy, Sultan3, Zulfequar, Mohammad1, mzulfe@redifmail.com |
| Source: | Journal of Materials Science: Materials in Electronics; Dec2024, Vol. 35 Issue 36, p1-19, 19p |
| Database: | Applied Science & Technology Source |
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