Electrical properties of ScN thin films controlled by defect engineering using oxygen ion implantation.

Saved in:
Bibliographic Details
Title: Electrical properties of ScN thin films controlled by defect engineering using oxygen ion implantation.
Authors: Poterie, Charlotte1, Bouteiller, Hugo1, Burcea, Razvan1,2, Dubois, Sylvain1, Eklund, Per3,4, Le Febvrier, Arnaud3,4, arnaud.le.febvrier@liu.se, Cabioc'h, Thierry1, Barbot, Jean-François1, jean.francois.barbot@univ-poitiers.fr
Source: Journal of Applied Physics; 1/7/2025, Vol. 137 Issue 1, p1-11, 11p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/5.0230961