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Analysis of the structural and optical characteristics of ZnSe thin films as interface layer.

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Bibliographic Details
Title:	Analysis of the structural and optical characteristics of ZnSe thin films as interface layer.
Authors:	Emir, Cansu^1,2, Tataroglu, Adem³, Gökmen, Uğur⁴, Ocak, Sema Bilge^1,5, sbocak@gazi.edu.tr
Source:	Journal of Materials Science: Materials in Electronics; Jan2025, Vol. 36 Issue 2, p1-12, 12p
Database:	Applied Science & Technology Source
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Description
ISSN:	09574522
DOI:	10.1007/s10854-025-14221-3