Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response.
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| Title: | Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response. |
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| Authors: | Pan, Xingyu1, Zhao, Sheng2, Qi, Lin3, He, Xiaobin4, Wan, Jing1, Li, Hailong1, dragoneptech@163.com |
| Source: | Journal of Materials Science: Materials in Electronics; Jan2025, Vol. 36 Issue 3, p1-15, 15p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-025-14255-7 |