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Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response.

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Title: Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response.
Authors: Pan, Xingyu1, Zhao, Sheng2, Qi, Lin3, He, Xiaobin4, Wan, Jing1, Li, Hailong1, dragoneptech@163.com
Source: Journal of Materials Science: Materials in Electronics; Jan2025, Vol. 36 Issue 3, p1-15, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 182426699
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response.
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  Data: <searchLink fieldCode="AU" term="%22Pan%2C+Xingyu%22">Pan, Xingyu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhao%2C+Sheng%22">Zhao, Sheng</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Qi%2C+Lin%22">Qi, Lin</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22He%2C+Xiaobin%22">He, Xiaobin</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Wan%2C+Jing%22">Wan, Jing</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Hailong%22">Li, Hailong</searchLink><relatesTo>1</relatesTo>, <i>dragoneptech@163.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jan2025, Vol. 36 Issue 3, p1-15, 15p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=182426699
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      – Type: doi
        Value: 10.1007/s10854-025-14255-7
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      – Code: eng
        Text: English
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        PageCount: 15
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      – TitleFull: Random vibration lifetime prediction model based on overshoot correction for metal hermetic sealing structure considering transient response.
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            NameFull: Pan, Xingyu
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            NameFull: Zhao, Sheng
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            NameFull: Qi, Lin
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            NameFull: He, Xiaobin
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            NameFull: Wan, Jing
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            – D: 21
              M: 01
              Text: Jan2025
              Type: published
              Y: 2025
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              Value: 36
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