Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al.
Saved in:
| Title: | Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al. |
|---|---|
| Authors: | Cao, Hechun1, Zhao, Dongyang1, Hu, Tao1, Zheng, Yunzhe1, Bai, Wei1, wbai@mail.sitp.ac.cn, Chen, Yan2, Yang, Jing1, Zhang, Yuanyuan1, Cheng, Yan1, Huang, Rong1, Tang, Xiaodong1, xdtang@sist.ecnu.edu.cn, Wang, Jianlu2, jlwang@mail.sitp.ac.cn, Chu, Junhao2 |
| Source: | Journal of Electronic Materials; Apr2025, Vol. 54 Issue 4, p2913-2920, 8p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 03615235 |
|---|---|
| DOI: | 10.1007/s11664-025-11772-3 |
