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Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al.

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Title: Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al.
Authors: Cao, Hechun1, Zhao, Dongyang1, Hu, Tao1, Zheng, Yunzhe1, Bai, Wei1, wbai@mail.sitp.ac.cn, Chen, Yan2, Yang, Jing1, Zhang, Yuanyuan1, Cheng, Yan1, Huang, Rong1, Tang, Xiaodong1, xdtang@sist.ecnu.edu.cn, Wang, Jianlu2, jlwang@mail.sitp.ac.cn, Chu, Junhao2
Source: Journal of Electronic Materials; Apr2025, Vol. 54 Issue 4, p2913-2920, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 183624058
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Apr2025, Vol. 54 Issue 4, p2913-2920, 8p
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      – Type: doi
        Value: 10.1007/s11664-025-11772-3
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        Text: English
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      – TitleFull: Identification and Mitigation Strategies of Etch Pit-Associated Defects in MBE-Grown HgCdTe Thin Films: Identification and Mitigation Strategies of Etch-pit-associated: H. Cao et al.
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              M: 04
              Text: Apr2025
              Type: published
              Y: 2025
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