New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.

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Bibliographic Details
Title:	New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.
Authors:	Callari, Jim
Source:	Plastics Technology; Apr2025, Vol. 71 Issue 4, p10-13, 3p
Database:	Applied Science & Technology Source

Description
ISSN:	00321257