New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.

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Bibliographic Details
Title: New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.
Authors: Callari, Jim
Source: Plastics Technology; Apr2025, Vol. 71 Issue 4, p10-13, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 184182852
AccessLevel: 2
PubType: Periodical
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PreciseRelevancyScore: 0
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  Data: New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=184182852
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      – Code: eng
        Text: English
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        PageCount: 3
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      – TitleFull: New System Utilizes EMF Technology to Measure Sheet Thickness, Temperature.
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            NameFull: Callari, Jim
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            – D: 01
              M: 04
              Text: Apr2025
              Type: published
              Y: 2025
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