APA (7th ed.) Citation

Kaspar, T. C., Akers, S., Sprueill, H. W., Ter-Petrosyan, A. H., Bilbrey, J. A., Hopkins, D., . . . Comes, R. B. (2025). Machine-learning-enabled on-the-fly analysis of RHEED patterns during thin film deposition by molecular beam epitaxy. Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, 43(3), 1. https://doi.org/10.1116/6.0004493

Chicago Style (17th ed.) Citation

Kaspar, Tiffany C., et al. "Machine-learning-enabled On-the-fly Analysis of RHEED Patterns During Thin Film Deposition by Molecular Beam Epitaxy." Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films 43, no. 3 (2025): 1. https://doi.org/10.1116/6.0004493.

MLA (9th ed.) Citation

Kaspar, Tiffany C., et al. "Machine-learning-enabled On-the-fly Analysis of RHEED Patterns During Thin Film Deposition by Molecular Beam Epitaxy." Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, vol. 43, no. 3, 2025, p. 1, https://doi.org/10.1116/6.0004493.