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Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.

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Bibliographic Details
Title: Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.
Authors: Ebdah, M. A.1, emohammad@alcorn.edu, Kordesch, M. E.2, Jadwisienczak, W. M.3, Ibdah, A.4
Source: Journal of Electronic Materials; Jul2025, Vol. 54 Issue 7, p5630-5643, 14p
Database: Applied Science & Technology Source
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Description
ISSN:03615235
DOI:10.1007/s11664-024-11676-8