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Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.

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Title: Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.
Authors: Ebdah, M. A.1, emohammad@alcorn.edu, Kordesch, M. E.2, Jadwisienczak, W. M.3, Ibdah, A.4
Source: Journal of Electronic Materials; Jul2025, Vol. 54 Issue 7, p5630-5643, 14p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 185782298
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s11664-024-11676-8
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      – Code: eng
        Text: English
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        PageCount: 14
        StartPage: 5630
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      – TitleFull: Spectroscopic Ellipsometry and Optimized B-Spline Coefficients of Non-hydrogenated Amorphous Silicon for Amorphous Silicon-Based Semiconductors.
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            NameFull: Ebdah, M. A.
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            NameFull: Kordesch, M. E.
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            NameFull: Jadwisienczak, W. M.
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            – D: 01
              M: 07
              Text: Jul2025
              Type: published
              Y: 2025
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              Value: 54
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              Value: 7
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