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Analysis of Threading Edge Dislocation Low-Angle Grain Boundary Network Distributions in 4H-SiC Wafers Through Synchrotron X-ray Topography and Ray-Tracing Simulation.

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Title: Analysis of Threading Edge Dislocation Low-Angle Grain Boundary Network Distributions in 4H-SiC Wafers Through Synchrotron X-ray Topography and Ray-Tracing Simulation.
Authors: Cheng, Qianyu1, qyjcheng@gmail.com, Chen, Zeyu1, zeyu.chen@stonybrook.edu, Hu, Shanshan1, shanshan.hu@stonybrook.edu, Raghothamachar, Balaji1, balaji.raghothamachar@stonybrook.edu, Dudley, Michael1, michael.dudley@stonybrook.edu
Source: Journal of Electronic Materials; Jul2025, Vol. 54 Issue 7, p5037-5050, 14p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 185782302
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PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Analysis of Threading Edge Dislocation Low-Angle Grain Boundary Network Distributions in 4H-SiC Wafers Through Synchrotron X-ray Topography and Ray-Tracing Simulation.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Cheng%2C+Qianyu%22">Cheng, Qianyu</searchLink><relatesTo>1</relatesTo>, <i>qyjcheng@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Chen%2C+Zeyu%22">Chen, Zeyu</searchLink><relatesTo>1</relatesTo>, <i>zeyu.chen@stonybrook.edu</i><br /><searchLink fieldCode="AU" term="%22Hu%2C+Shanshan%22">Hu, Shanshan</searchLink><relatesTo>1</relatesTo>, <i>shanshan.hu@stonybrook.edu</i><br /><searchLink fieldCode="AU" term="%22Raghothamachar%2C+Balaji%22">Raghothamachar, Balaji</searchLink><relatesTo>1</relatesTo>, <i>balaji.raghothamachar@stonybrook.edu</i><br /><searchLink fieldCode="AU" term="%22Dudley%2C+Michael%22">Dudley, Michael</searchLink><relatesTo>1</relatesTo>, <i>michael.dudley@stonybrook.edu</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Jul2025, Vol. 54 Issue 7, p5037-5050, 14p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=185782302
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11664-025-11793-y
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 14
        StartPage: 5037
    Titles:
      – TitleFull: Analysis of Threading Edge Dislocation Low-Angle Grain Boundary Network Distributions in 4H-SiC Wafers Through Synchrotron X-ray Topography and Ray-Tracing Simulation.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Cheng, Qianyu
      – PersonEntity:
          Name:
            NameFull: Chen, Zeyu
      – PersonEntity:
          Name:
            NameFull: Hu, Shanshan
      – PersonEntity:
          Name:
            NameFull: Raghothamachar, Balaji
      – PersonEntity:
          Name:
            NameFull: Dudley, Michael
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: Jul2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 03615235
          Numbering:
            – Type: volume
              Value: 54
            – Type: issue
              Value: 7
          Titles:
            – TitleFull: Journal of Electronic Materials
              Type: main
ResultId 1