High surface quality Y2SiO5 silicate-crystal waveguides etched by chlorine-based inductive coupled plasma reactive ion etching.
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| Title: | High surface quality Y2SiO5 silicate-crystal waveguides etched by chlorine-based inductive coupled plasma reactive ion etching. |
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| Authors: | Talneau, A.1, anne.talneau@c2n.upsaclay.fr, Chan, M.2, Laourine, F.1, Maillard, F.1, Welinski, S.2, Berger, P.2, Ferrier, A.3,4 |
| Source: | Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2025, Vol. 43 Issue 4, p1-8, 8p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 186471913 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: High surface quality Y2SiO5 silicate-crystal waveguides etched by chlorine-based inductive coupled plasma reactive ion etching. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Talneau%2C+A%2E%22">Talneau, A.</searchLink><relatesTo>1</relatesTo>, <i>anne.talneau@c2n.upsaclay.fr</i><br /><searchLink fieldCode="AU" term="%22Chan%2C+M%2E%22">Chan, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Laourine%2C+F%2E%22">Laourine, F.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Maillard%2C+F%2E%22">Maillard, F.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Welinski%2C+S%2E%22">Welinski, S.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Berger%2C+P%2E%22">Berger, P.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Ferrier%2C+A%2E%22">Ferrier, A.</searchLink><relatesTo>3,4</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+A-Vacuums%2C+Surfaces+%26+Films%22">Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films</searchLink>; Jul2025, Vol. 43 Issue 4, p1-8, 8p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=186471913 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1116/6.0004314 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1 Titles: – TitleFull: High surface quality Y2SiO5 silicate-crystal waveguides etched by chlorine-based inductive coupled plasma reactive ion etching. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Talneau, A. – PersonEntity: Name: NameFull: Chan, M. – PersonEntity: Name: NameFull: Laourine, F. – PersonEntity: Name: NameFull: Maillard, F. – PersonEntity: Name: NameFull: Welinski, S. – PersonEntity: Name: NameFull: Berger, P. – PersonEntity: Name: NameFull: Ferrier, A. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 07342101 Numbering: – Type: volume Value: 43 – Type: issue Value: 4 Titles: – TitleFull: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films Type: main |
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