APA (7th ed.) Citation

Humiston, A., Lau, M. L., Stack, T., Restuccia, E., Herrera-Gomez, A., Long, M., . . . Terry, J. (2025). Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package. Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, 43(4), 1. https://doi.org/10.1116/6.0004326

Chicago Style (17th ed.) Citation

Humiston, Alaina, Miu Lun Lau, Tim Stack, Evan Restuccia, Alberto Herrera-Gomez, Min Long, Daniel T. Olive, and Jeff Terry. "Analysis of X-ray Emission Spectroscopy (XES) Data Using Artificial Intelligence Techniques Included in the XES Neo Package." Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films 43, no. 4 (2025): 1. https://doi.org/10.1116/6.0004326.

MLA (9th ed.) Citation

Humiston, Alaina, et al. "Analysis of X-ray Emission Spectroscopy (XES) Data Using Artificial Intelligence Techniques Included in the XES Neo Package." Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films, vol. 43, no. 4, 2025, p. 1, https://doi.org/10.1116/6.0004326.