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Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package.

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Bibliographic Details
Title: Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package.
Authors: Humiston, Alaina1,2, Lau, Miu Lun3, Stack, Tim1, Restuccia, Evan1, Herrera-Gomez, Alberto4, Long, Min3, Olive, Daniel T.2, Terry, Jeff1,5, terryj@iit.edu
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2025, Vol. 43 Issue 4, p1-10, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 186471951
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Label: Title
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  Data: Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package.
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  Data: <searchLink fieldCode="AU" term="%22Humiston%2C+Alaina%22">Humiston, Alaina</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lau%2C+Miu+Lun%22">Lau, Miu Lun</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Stack%2C+Tim%22">Stack, Tim</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Restuccia%2C+Evan%22">Restuccia, Evan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Herrera-Gomez%2C+Alberto%22">Herrera-Gomez, Alberto</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Long%2C+Min%22">Long, Min</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Olive%2C+Daniel+T%2E%22">Olive, Daniel T.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Terry%2C+Jeff%22">Terry, Jeff</searchLink><relatesTo>1,5</relatesTo>, <i>terryj@iit.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+A-Vacuums%2C+Surfaces+%26+Films%22">Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films</searchLink>; Jul2025, Vol. 43 Issue 4, p1-10, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=186471951
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1116/6.0004326
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 1
    Titles:
      – TitleFull: Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package.
        Type: main
  BibRelationships:
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      – PersonEntity:
          Name:
            NameFull: Humiston, Alaina
      – PersonEntity:
          Name:
            NameFull: Lau, Miu Lun
      – PersonEntity:
          Name:
            NameFull: Stack, Tim
      – PersonEntity:
          Name:
            NameFull: Restuccia, Evan
      – PersonEntity:
          Name:
            NameFull: Herrera-Gomez, Alberto
      – PersonEntity:
          Name:
            NameFull: Long, Min
      – PersonEntity:
          Name:
            NameFull: Olive, Daniel T.
      – PersonEntity:
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            NameFull: Terry, Jeff
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      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: Jul2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 07342101
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            – Type: volume
              Value: 43
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
              Type: main
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