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Simultaneous Submicron Temperature Mapping of Substrate and Channel in P-GaN/AlGaN/GaN HEMTs Using Raman Thermometry.

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Title: Simultaneous Submicron Temperature Mapping of Substrate and Channel in P-GaN/AlGaN/GaN HEMTs Using Raman Thermometry.
Authors: Kim, Jaesun1, Lim, Seungyoung2, Choi, Gyeong Eun1,3, Park, Jung-ki1,4, Cha, Ho-Young3,4,5, Kwak, Cheol-Ho1,4, Lim, Jinhong2,4, Moon, Youngboo3,5, Song, Jung-Hoon1,2,4, jh-song@kongju.ac.kr
Source: Applied Sciences (2076-3417); Jul2025, Vol. 15 Issue 14, p7860, 14p
Database: Applied Science & Technology Source
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ISSN:20763417
DOI:10.3390/app15147860