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X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping.

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Title: X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping.
Authors: Stanchu, Hryhorii1, Kryvyi, Serhii1, de Oliveira, Fernando M.1, Margiotta, Stephen2, Cook, Matthew2, Mazur, Yuriy I.1, Grant, Perry C.3, Du, Wei1,4, Li, Baohua3, Salamo, Gregory1,5, Yu, Shui-Qing1,4, syu@uark.edu
Source: Journal of Applied Physics; 9/14/2025, Vol. 138 Issue 10, p1-8, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187951635
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping.
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  Data: <searchLink fieldCode="AU" term="%22Stanchu%2C+Hryhorii%22">Stanchu, Hryhorii</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kryvyi%2C+Serhii%22">Kryvyi, Serhii</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22de+Oliveira%2C+Fernando+M%2E%22">de Oliveira, Fernando M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Margiotta%2C+Stephen%22">Margiotta, Stephen</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Cook%2C+Matthew%22">Cook, Matthew</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Mazur%2C+Yuriy+I%2E%22">Mazur, Yuriy I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Grant%2C+Perry+C%2E%22">Grant, Perry C.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Du%2C+Wei%22">Du, Wei</searchLink><relatesTo>1,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Baohua%22">Li, Baohua</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Salamo%2C+Gregory%22">Salamo, Gregory</searchLink><relatesTo>1,5</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu%2C+Shui-Qing%22">Yu, Shui-Qing</searchLink><relatesTo>1,4</relatesTo>, <i>syu@uark.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; 9/14/2025, Vol. 138 Issue 10, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187951635
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        Value: 10.1063/5.0291304
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        Text: English
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      – TitleFull: X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping.
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              M: 09
              Text: 9/14/2025
              Type: published
              Y: 2025
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              Value: 138
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