Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes.
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| Title: | Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes. |
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| Authors: | Nabipour, Saeideh1, nabipour@uni-bremen.de, Javidan, Javad2, javidan@uma.ac.ir |
| Source: | Journal of Circuits, Systems & Computers; 11/30/2025, Vol. 34 Issue 17, p1-25, 25p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02181266 |
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| DOI: | 10.1142/S0218126624502256 |
