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Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes.

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Title: Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes.
Authors: Nabipour, Saeideh1, nabipour@uni-bremen.de, Javidan, Javad2, javidan@uma.ac.ir
Source: Journal of Circuits, Systems & Computers; 11/30/2025, Vol. 34 Issue 17, p1-25, 25p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1142/S0218126624502256
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      – Code: eng
        Text: English
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        PageCount: 25
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      – TitleFull: Enhancing Data Storage Reliability and Error Correction in Multilevel NOR and NAND Flash Memories Through Optimal Design of BCH Codes.
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              Text: 11/30/2025
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