View in EDS HTML Full Text PDF Full Text

Investigation of the Electrical Mechanism in an Ag/pSiO 2 /Si MIS Heterojunction: Effect of the Oxidation Temperature.

Saved in:

Bibliographic Details
Title:	Investigation of the Electrical Mechanism in an Ag/pSiO 2 /Si MIS Heterojunction: Effect of the Oxidation Temperature.
Authors:	Nouri, Hassen¹, Choubani, Karim², Ouertani, Rachid^1,3, Ben Rabha, Mohamed^1,3
Source:	Crystals (2073-4352); Sep2025, Vol. 15 Issue 9, p763, 11p
Database:	Applied Science & Technology Source
Full text is not displayed to guests. Login for full access.

Description
ISSN:	20734352
DOI:	10.3390/cryst15090763