Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise.
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| Title: | Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise. |
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| Authors: | Modregger, Peter1,2, peter.modregger@uni-siegen.de, Wittwer, Felix1,2, Khaliq, Ahmar1,2, Pyrlik, Niklas2,3, Ball, James A. D.4, Garrevoet, Jan5, Falkenberg, Gerald5, Liehr, Alexander6, Stuckelberger, Michael2 |
| Source: | Journal of Applied Crystallography; Oct2025, Vol. 58 Issue 5, p1653-1658, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218898 |
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| DOI: | 10.1107/S1600576725006715 |
