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Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise.

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Title: Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise.
Authors: Modregger, Peter1,2, peter.modregger@uni-siegen.de, Wittwer, Felix1,2, Khaliq, Ahmar1,2, Pyrlik, Niklas2,3, Ball, James A. D.4, Garrevoet, Jan5, Falkenberg, Gerald5, Liehr, Alexander6, Stuckelberger, Michael2
Source: Journal of Applied Crystallography; Oct2025, Vol. 58 Issue 5, p1653-1658, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188493214
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise.
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  Data: <searchLink fieldCode="AU" term="%22Modregger%2C+Peter%22">Modregger, Peter</searchLink><relatesTo>1,2</relatesTo>, <i>peter.modregger@uni-siegen.de</i><br /><searchLink fieldCode="AU" term="%22Wittwer%2C+Felix%22">Wittwer, Felix</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Khaliq%2C+Ahmar%22">Khaliq, Ahmar</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Pyrlik%2C+Niklas%22">Pyrlik, Niklas</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Ball%2C+James+A%2E+D%2E%22">Ball, James A. D.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Garrevoet%2C+Jan%22">Garrevoet, Jan</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Falkenberg%2C+Gerald%22">Falkenberg, Gerald</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Liehr%2C+Alexander%22">Liehr, Alexander</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Stuckelberger%2C+Michael%22">Stuckelberger, Michael</searchLink><relatesTo>2</relatesTo>
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188493214
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1107/S1600576725006715
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 1653
    Titles:
      – TitleFull: Ultimate sensitivity in X‐ray diffraction: angular moments versus shot noise.
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            NameFull: Modregger, Peter
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            NameFull: Wittwer, Felix
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            NameFull: Khaliq, Ahmar
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            NameFull: Pyrlik, Niklas
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            NameFull: Ball, James A. D.
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            NameFull: Garrevoet, Jan
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            NameFull: Falkenberg, Gerald
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            – D: 01
              M: 10
              Text: Oct2025
              Type: published
              Y: 2025
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              Value: 58
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              Value: 5
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            – TitleFull: Journal of Applied Crystallography
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