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Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.

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Bibliographic Details
Title: Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.
Authors: Maier, C.1, maierc@hochschule-trier.de, Rachwalsky, P.1, Wittmann, A.1, Koch, K. P.1, Fischer, G.2
Source: Materialwissenschaft und Werkstoffechnik; Sep2025, Vol. 56 Issue 9, p1225-1234, 10p
Database: Applied Science & Technology Source
Description
ISSN:09335137
DOI:10.1002/mawe.70029