APA (7th ed.) Citation

Maier, C., Rachwalsky, P., Wittmann, A., Koch, K. P., & Fischer, G. (2025). Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis. Materialwissenschaft und Werkstoffechnik, 56(9), 1225. https://doi.org/10.1002/mawe.70029

Chicago Style (17th ed.) Citation

Maier, C., P. Rachwalsky, A. Wittmann, K. P. Koch, and G. Fischer. "Characterizing Surface Roughness Evolution in Copper Conductors Under Mechanical Strain Using Power Spectral Density Analysis." Materialwissenschaft Und Werkstoffechnik 56, no. 9 (2025): 1225. https://doi.org/10.1002/mawe.70029.

MLA (9th ed.) Citation

Maier, C., et al. "Characterizing Surface Roughness Evolution in Copper Conductors Under Mechanical Strain Using Power Spectral Density Analysis." Materialwissenschaft Und Werkstoffechnik, vol. 56, no. 9, 2025, p. 1225, https://doi.org/10.1002/mawe.70029.