Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.

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Title: Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.
Authors: Maier, C.1, maierc@hochschule-trier.de, Rachwalsky, P.1, Wittmann, A.1, Koch, K. P.1, Fischer, G.2
Source: Materialwissenschaft und Werkstoffechnik; Sep2025, Vol. 56 Issue 9, p1225-1234, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188927602
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Materialwissenschaft+und+Werkstoffechnik%22">Materialwissenschaft und Werkstoffechnik</searchLink>; Sep2025, Vol. 56 Issue 9, p1225-1234, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=188927602
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        Value: 10.1002/mawe.70029
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 1225
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      – TitleFull: Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.
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            NameFull: Maier, C.
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            NameFull: Wittmann, A.
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              M: 09
              Text: Sep2025
              Type: published
              Y: 2025
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              Value: 56
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