View in EDS

Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.

Saved in:
Bibliographic Details
Title: Characterizing surface roughness evolution in copper conductors under mechanical strain using power spectral density analysis.
Authors: Maier, C.1, maierc@hochschule-trier.de, Rachwalsky, P.1, Wittmann, A.1, Koch, K. P.1, Fischer, G.2
Source: Materialwissenschaft und Werkstoffechnik; Sep2025, Vol. 56 Issue 9, p1225-1234, 10p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first