Metric information mining with metric attention to boost software defect prediction performance.
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| Title: | Metric information mining with metric attention to boost software defect prediction performance. |
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| Authors: | Ding, Yongchang1, Han, Wei1, Li, Zhiqiang2, Chen, Haowen3, Chen, Linjun1, Peng, Rong1, rongpeng@whu.edu.cn, Jing, Xiao-Yuan1,4, jingxy_2000@126.com |
| Source: | Science of Computer Programming; Mar2026, Vol. 248, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 01676423 |
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| DOI: | 10.1016/j.scico.2025.103381 |
