APA (7th ed.) Citation

Ding, Y., Han, W., Li, Z., Chen, H., Chen, L., Peng, R., & Jing, X. (2026). Metric information mining with metric attention to boost software defect prediction performance. Science of Computer Programming, 248, N.PAG. https://doi.org/10.1016/j.scico.2025.103381

Chicago Style (17th ed.) Citation

Ding, Yongchang, Wei Han, Zhiqiang Li, Haowen Chen, Linjun Chen, Rong Peng, and Xiao-Yuan Jing. "Metric Information Mining with Metric Attention to Boost Software Defect Prediction Performance." Science of Computer Programming 248 (2026): N.PAG. https://doi.org/10.1016/j.scico.2025.103381.

MLA (9th ed.) Citation

Ding, Yongchang, et al. "Metric Information Mining with Metric Attention to Boost Software Defect Prediction Performance." Science of Computer Programming, vol. 248, 2026, p. N.PAG, https://doi.org/10.1016/j.scico.2025.103381.